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    2005 KOBELCO SBW-330R Used Industrial Machines Shop / Warehouse for sale2005 KOBELCO SBW-330R Used Industrial Machines Shop / Warehouse for sale
    2005 KOBELCO SBW-330R Used Industrial Machines Shop / Warehouse for sale2005 KOBELCO SBW-330R Used Industrial Machines Shop / Warehouse for sale
    2005 KOBELCO SBW-330R Used Industrial Machines Shop / Warehouse for sale2005 KOBELCO SBW-330R Used Industrial Machines Shop / Warehouse for sale
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    Seller Information

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    GIH Co. Ltd

    Contact:Jerry Yiu

    Taipei City, Taiwan 94033010

    General

    Category
    Industrial Machines Shop / Warehouse
    Manufacturer
    KOBELCO
    Model
    SBW-330R
    Condition
    Used
    Stock Number
    SOTW80000
    Description
    The 2005 Kobelco SBW-330R is a precision measurement system designed for assessing wafer bow and warp in semiconductor manufacturing processes. Made primarily of iron, this unit includes integrated vacuum pumps and supports utility changes for detailed designs. It is currently not functioning properly due to a damaged PC ADI conversion card (IBX-3157), which makes measurements untranslatable, and a worn STAGE slide rail causing loss of horizontal accuracy, excessive fluctuations, and distorted graphics. Other components and functions are normal. Secondary configurations allow replacement of the input voltage source during installation, with the internal transformer changed to a 100V source by the manufacturer. Does not include the computer. Specifications: Machine Type: Wafer Measurement System Function: Bow/WARP Measurement Manufacturer: Kobelco Model: SBW-330R Manufacture Year: 2005 Origin: Japan Power Supply: AC200 +10% [V] Single phase, 10[A] 50/60[Hz], Direct connection to breaker (Screw size M5), 1 Port Compressed Air: 0.5 ~ 0.7 [MPa], 10 [Nl/min] or above, Joint φ 6 mm, One-touch joint, 1 Port Vacuum: -80 [MPa], Joint φ 6 mm, One-touch joint, 2 Ports Quantity: 1 Main Material: Iron Condition: Used (damaged IBX-3157 card and worn STAGE slide rail, repair required) Location: Taiwan Applications: Wafer bow and warp inspection Semiconductor production quality control Precision measurement in electronics manufacturing